This system combines design elements from Olympus inverted microscope and high-speed CMOS camera to detect the visualized process of photoexcited charge carrier dynamics in micro/nanoscale samples. It also features micro-area transient reflectance (transmission) spectroscopy and dynamic testing capabilities. The system possesses ultrafast time resolution (femtoseconds) and spatial resolution of up to 500nm.

product details

Application instance

Video Introduction

Specification

Microspectroscopy detection range	400-1500nm
Detection mode	transmission/reflection/micro-area/imaging
Highest spatial resolution	500nm
Highest time resolution	1.5 times the laser pulse width
Time window	8ns
Imaging wavelength range	400-800nm
Imaging pixel points	640x480
Zero-point pre-signal-to-noise ratio	≤0.2mOD
Equipment expandability	Expandable to conventional sample chambersfor transient absorption spectroscopy testing from 380-1650nm Can be coupled with a cryostat, probestage, electrochemical control device, and external magnetic field.

Application Example 1- Micro area Transmission Test
Experimental conditions:
Excitation light wavelength	515nm	Number of scan delay time points	159
Objective magnification	50X	Number of scans	3次
Integration time per point	1.2s	Total testing time	9min45s

Application Example 2 - Microzone ReflectionTesting
Experimental Conditions:
Excitation Light Wavelength	515nm	Number of Scan Delay Time Points	59
Objective Magnification	50X	Number of Scans	3次
Integration Time per Point:	1.2s	Total Testing Time	9min45s

Application Example 3 - Wide-field TA Imaging
Experimental Conditions:
Excitation Light Wavelength	515nm	Acquisition Frequency	1kHz
Detection Light Wavelength	660nm	Integration Time per Single Frame	1s
Sample Name	Monolayer WS2 (Substrate: Sapphire)	Number of Scan Points	159
Objective Magnification	50X	Number of Scans	5
Detection Size	30x45 micrometers	Total Testing Tim	16min

Application Example 4 - Carrier DiffusionImaging
Experimental Conditions:
Excitation Light Wavelength	400nm	Integration Time per Single Frame:	6 s
Detection Light Wavelength	650nm	Number of Scan Points	109
Sample Name	Bi202Se Single Crystal	Number of Scans	1次
Objective Magnification	50X	Total Testing Time	11min

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Service hotline：0411-3987 6096 sales hotline：（+86）-150 4052 0524 /（+86）-133 7365 1058 Enterprise email：sales@timetechspectra.com

address：Room 01-02, 1st Floor, No. 7 Huixian Park, Dalian High tech Industrial Park

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