前 Ultrafast Transient Absorption Microscopy System
This system combines design elements from Olympus inverted microscope and high-speed CMOS camera to detect the visualized process of photoexcited charge carrier dynamics in micro/nanoscale samples. It also features micro-area transient reflectance (transmission) spectroscopy and dynamic testing capabilities. The system possesses ultrafast time resolution (femtoseconds) and spatial resolution of up to 500nm.
product details
Application instance
Video Introduction
Specification
Microspectroscopy detection range
400-1500nm
Detection mode
transmission/reflection/micro-area/imaging
Highest spatial resolution
500nm
Highest time resolution
1.5 times the laser pulse width
Time window
8ns
Imaging wavelength range
400-800nm
Imaging pixel points
640x480
Zero-point pre-signal-to-noise ratio
≤0.2mOD
Equipment expandability
Expandable to conventional sample chambersfor transient absorption spectroscopy testing from 380-1650nm
Can be coupled with a cryostat, probestage, electrochemical control device, and external magnetic field.
Application Example 1- Micro area Transmission Test
Experimental conditions:
Excitation light wavelength
515nm
Number of scan delay time points
159
Objective magnification
50X
Number of scans
3次
Integration time per point
1.2s
Total testing time
9min45s
Application Example 2 - Microzone ReflectionTesting