前 Ultrafast Transient Absorption Microscopy System

This system combines design elements from Olympus inverted microscope and high-speed CMOS camera to detect the visualized process of photoexcited charge carrier dynamics in micro/nanoscale samples. It also features micro-area transient reflectance (transmission) spectroscopy and dynamic testing capabilities. The system possesses ultrafast time resolution (femtoseconds) and spatial resolution of up to 500nm.
product details
Application instance
Video Introduction

Specification


Microspectroscopy detection range

400-1500nm

Detection mode

transmission/reflection/micro-area/imaging

Highest spatial resolution

500nm

Highest time resolution

1.5 times the laser pulse width

Time window

8ns

Imaging wavelength range

400-800nm

Imaging pixel points

640x480

Zero-point pre-signal-to-noise ratio

≤0.2mOD

Equipment expandability

Expandable to conventional sample chambersfor transient absorption spectroscopy testing from 380-1650nm

Can be coupled with a cryostat, probestage, electrochemical control device, and external magnetic field.


Application Example 1- Micro area Transmission Test

Experimental conditions:

Excitation light wavelength515nmNumber of scan delay time points159
Objective magnification50XNumber of scans3次
Integration time per point1.2sTotal testing time9min45s



Application Example 2 - Microzone ReflectionTesting


Experimental Conditions:

Excitation Light Wavelength515nmNumber of Scan Delay Time Points59
Objective Magnification50XNumber of Scans3次
Integration Time per Point:1.2sTotal Testing Time9min45s



Application Example 3 - Wide-field TA Imaging

Experimental Conditions:

Excitation Light Wavelength515nmAcquisition Frequency1kHz
Detection Light Wavelength660nm    Integration Time per Single Frame1s
Sample NameMonolayer WS2 (Substrate: Sapphire)Number of Scan Points159
Objective Magnification50X   Number of Scans5
Detection Size30x45 micrometersTotal Testing Tim16min




Application Example 4 - Carrier DiffusionImaging

Experimental Conditions:

Excitation Light Wavelength400nmIntegration Time per Single Frame:6 s
Detection Light Wavelength650nm   Number of Scan Points109
Sample NameBi202Se Single CrystalNumber of Scans1次
Objective Magnification50X   Total Testing Time11min






CONTACT US
Service hotline:0411-3987 6096 sales hotline:(+86)-150  4052  0524  /(+86)-133  7365  1058 Enterprise email:sales@timetechspectra.com
address:Room 01-02, 1st Floor, No. 7 Huixian Park, Dalian High     tech Industrial Park
Scan to follow Chuangrui Spectrum official account
©Copyright Timetech Spectra 2016-2023 All Rights Reserved 地址:大连高新技术产业园区汇贤园7号1层#01-02室.ICP备案号:辽ICP备20008848号-1