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Ultrafast Transient Absorption Spectroscopy System
Ultrafast Transient Absorption Microscopy System
Nanosecond Transient Absorption Spectroscopy Syste
Flash Photolysis System
Ultrafast Shadow Pump-Probe Detection System
Ultrafast Time-Resolved Terahertz Spectrometer
Transient Absorption Series
Steady-State/Transient Fluorescence Spectroscopy S
Multifunctional Fluorescence Imaging System
Multifunctional High-Speed Laser Scanning Confocal
Ultrafast Fluorescence Spectroscopy System
Ultrafast Up-conversion Fluorescence Spectroscopy
Fluorescence Spectroscopy Series
Z-Scan Testing System
Nonlinear Second Harmonic Generation (SHG) Testing
Nonlinear Optics Series
Photocurrent Imaging System
1Photodetection Series
High-Speed Fiber Spectrometer
High-Speed Detectors
High-Energy DPSS Nd:YAG Nanosecond Pulse Laser
Optical Parametric Oscillator (OPO)
Nanosecond Laser
Silicon Carbide (SiC) Wafer Quality Imaging Inspec
COMMODITY
Transient Absorption Spectroscopy Series
Ultrafast Transient Absorption Spectroscopy
Flash Photolysis System
Ultrafast Pump-Probe Shadowgraph lmaging System
Ultrafast Time-Resolved Terahertz(THz) Spectromete
Fluorescence Spectroscopy Series
Steady-State/Transient Fluorescence Spectroscopy
Deep Ultraviolet (DUV) Fluorescence System
Laser Scanning Confocal FluorescenceLifetime lmagi
Ultrafast Fluorescence Spectroscopy
Non-linear Optics Series
Z-scan System
SHG System
High-Speed Camera Series
High-Speed Camera
Laser with High Energy and High Frequency Series
High Energy DPSS ND:YAG Nanosecond Laser
High Energy and High Frequency DPSS YAG-OPO Laser
Z-Scan System-ZTS100
The photoelectric current imaging system is equipped with a high-precision electrically controlled displacement stage, which allows for high spatial resolution photoelectric current imaging with UV-IR lasers, xenon lamps, LEDs, and other light sources. It can also integrate nanosecond lasers and oscilloscopes to perform transient photoelectric voltage/current testing.
Non-linear Optics Series-Z-scan System-SHG100
The nonlinear SHG testing system can achieve polarization testing and imaging of SHG. The system changes the polarization direction of the laser by rotating the waveplate, without the need to rotate the sample, reducing the impact of vibration and improving the signal-to-noise ratio of the data. At the same time, the system can integrate an electronic displacement table or a laser scanning galvanometer to achieve SHG imaging. The system can also integrate fluorescence spectroscopy and various spectral detection modules such as fluorescence lifetime.
CONTACT US
Service hotline:0411-3987 6096 sales hotline:(+86)-150 4052 0524 /(+86)-133 7365 1058 Enterprise email:sales@timetechspectra.com
address:Room 01-02, 1st Floor, No. 7 Huixian Park, Dalian High
tech Industrial Park
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